Lock-in Thermography

By: Otwin Breitenstein, Wilhelm Warta, Martin C. SchubertMaterial type: TextTextSeries: Springer Series in Advanced MicroelectronicsPublication details: Springer International Publishing 2018Edition: 3rd ed. 2018ISBN: 9783319998251Subject(s): Physics and AstronomyOnline resources: Click here to access online
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Item type Current library Call number URL Status Date due Barcode Item holds
electronic book electronic book ICTS
Link to resource Accessible Online EBK15068
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