Statistical analysis of measurement error models and applications : proceedings of the AMSIMSSIAM joint summer research conference held June 1016, 1989, with support from the National Science Foundation and the U.S. Army Research Office
- Providence, R.I. : American Mathematical Society, c1990
- 1 online resource (xii, 248 p. : ill.)
- Contemporary mathematics v. 112 10983627 .
The AMSIMSSIAM Joint Summer Research Conference in the Mathematical Sciences on Statistical Analysis of Measurement Error Models and Applications was held at Humboldt State University, Arcata, California...T.p. verso.
Some history of functional and structural relationships ; Errorsinvariables regression problems in epidemiology ; Models with latent variables: LISREL versus PLS ; Prediction of true values for the measurement error model ; Analysis of residuals from measurement error models ; Errorsinvariables estimation in the presence of serially correlated observations ; Improvements of the naive approach to estimation in nonlinear errorsinvariables regression models ; Structural logistic regression measurement error models ; Measurement error model estimation using iteratively weighted least squares ; Problematic points in nonlinear calibration ; Instrumental variable estimation of the nonlinear measurement error model ; A likelihood ratio test for error covariance specification in nonlinear measurement error models ; Plotting techniques for errorsinvariables problems ; Perturbation theory and least squares with errors in the variables ; Orthogonal distance regression ; Computing error bounds for regression problems ; Asymptotic robustness of normal theory methods for the analysis of latent curves ; Bounded influence errorsinvariables regression ; Bounded influence estimation in the errorsinvariables model Peter Sprent ; Alice S Whittemore ; Hans Schneeweiss ; Wayne A Fuller ; Stephen M Miller ; John L Eltinge ; Leon Jay Gleser ; Leonard A Stefanski and Raymond J Carroll ; Daniel W Schafer ; Philip J Brown and Samuel D Oman ; Yasuo Amemiya ; Daniel J Schnell ; Cliff H Spiegelman ; G W Stewart ; Paul T Boggs and Janet E Rogers ; Nicholas J Higham ; M W Browne ; Chi Lun Cheng and John W Van Ness ; Victor J Yohai and Ruben H Zamar
9780821877005 (online)
Error analysis (Mathematics)
The AMSIMSSIAM Joint Summer Research Conference in the Mathematical Sciences on Statistical Analysis of Measurement Error Models and Applications was held at Humboldt State University, Arcata, California...T.p. verso.
Some history of functional and structural relationships ; Errorsinvariables regression problems in epidemiology ; Models with latent variables: LISREL versus PLS ; Prediction of true values for the measurement error model ; Analysis of residuals from measurement error models ; Errorsinvariables estimation in the presence of serially correlated observations ; Improvements of the naive approach to estimation in nonlinear errorsinvariables regression models ; Structural logistic regression measurement error models ; Measurement error model estimation using iteratively weighted least squares ; Problematic points in nonlinear calibration ; Instrumental variable estimation of the nonlinear measurement error model ; A likelihood ratio test for error covariance specification in nonlinear measurement error models ; Plotting techniques for errorsinvariables problems ; Perturbation theory and least squares with errors in the variables ; Orthogonal distance regression ; Computing error bounds for regression problems ; Asymptotic robustness of normal theory methods for the analysis of latent curves ; Bounded influence errorsinvariables regression ; Bounded influence estimation in the errorsinvariables model Peter Sprent ; Alice S Whittemore ; Hans Schneeweiss ; Wayne A Fuller ; Stephen M Miller ; John L Eltinge ; Leon Jay Gleser ; Leonard A Stefanski and Raymond J Carroll ; Daniel W Schafer ; Philip J Brown and Samuel D Oman ; Yasuo Amemiya ; Daniel J Schnell ; Cliff H Spiegelman ; G W Stewart ; Paul T Boggs and Janet E Rogers ; Nicholas J Higham ; M W Browne ; Chi Lun Cheng and John W Van Ness ; Victor J Yohai and Ruben H Zamar
9780821877005 (online)
Error analysis (Mathematics)